Probe Force Microscopy News Today

The advent of electrical Atomic Force Microscopy (AFM) modes has revolutionized the world of nanoscale analysis.

Due to the nature of light, a traditional optical microscope can be employed to attain a maximum magnification of around 800–1000x. For further magnification, scanning electron microscopes (SEMs) can be used, in this case the transmission electron microscopes (TEMs) can identify single atoms and so provide the highest magnification possible. Considering this information, why is the scanning probe microscope (SPM) employed as yet another type of microscope? One reason is that a to-be-investiga...