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How to Characterize Ferroelectric Materials

Studying ferroelectric materials can be done with the help of piezoresponse force microscopy (PFM), due to the sensitivity and nanometer-level resolution it inherits from AFM. Bruker discusses the best modes and practices in regards to PFM measurements in a new application note.
Louis Castel Bruker Nano Surfacesmar Piezoresponse Force Microscopy Vector Piezoresponse Force Microscopy Bruker Nano Force Microscopy
Source: azom.com

Hitachi High-Tech Launches the AFM100 Pro High-Sensitivity Scanning Probe Microscope System with Improved Detection Sensitivity

Pursuing improved sensitivity when measuring physical properties and measurement at atomic and molecular scalesTOKYO, June 28, 2022 - (JCN Newswire) - Hitachi High-Tech Corporation today announced the
Atomic Force Microscope Hitachi Ltd Tech Corporation High Tech Corporation High Sensitivity Scanning Probe Microscope System Hitachi High Tech

Lightwave-Driven Scanning Tunneling Microscopy

A team of researchers at Michigan State University have utilized lightwave-driven terahertz scanning tunneling microscopy and spectroscopy to probe 7-atom-wide armchair graphene nanoribbons (7-AGNRs) at ultralow heights. They have uncovered highly localized wave functions in GNR edges that conventional scanning tunneling microscopes have not revealed.
Graphene Nanoribbons Nature Communications Michigan State University University Of Bern Image Credit Quick Primer

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Scanning Probe Microscopy: What is it and Why is it Used

Due to the nature of light, a traditional optical microscope can be employed to attain a maximum magnification of around 800โ€“1000x. For further magnification, scanning electron microscopes (SEMs) can be used, in this case the transmission electron microscopes (TEMs) can identify single atoms and so provide the highest magnification possible. Considering this information, why is the scanning probe microscope (SPM) employed as yet another type of microscope? One reason is that a to-be-investiga...
Semilab Semiconductor Physics Laboratory Semilab Semiconductor Physics Laboratoryapr Kelvin Probe Force Microscopy Magnetic Force Microscopy Semilab Semiconductor Physics Scanning Probe

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