JEOL Introduces New Configuration of Its Broad Ion Beam Milling Cross Section
JEOL USA introduces a new configuration of its bestselling broad ion beam milling instrument, the Cross-section Polisher (CP). The CP is widely used for preparing pristine samples prior to high-resolution imaging and elemental analysis with the Scanning Electron Microscope (SEM). The upgraded configuration includes high-speed milling, sputter coating, cryo-preparation (down to LN2 temperature), and air-isolated transfer for atmosphere-sensitive specimens (for example Li batteries).
Traditional mechanical preparation of specimen surfaces for SEM imaging can introduce various artifacts, such as scratches and embedded polishing media, that obscure the original microstructure, crystallographic information, and precise layer thickness measurements. Broad ion beam polishing using the JEOL cross-section polisher (CP) offers pristine surface preparation with minimal artifacts. The JEOL CP is a tabletop instrument
JEOL USA introduces a new configuration of its bestselling broad ion beam milling instrument, the Cross-section Polisher (CP). The CP is widely used for preparing pristine samples prior to high resolution imaging and elemental analysis with the Scanning Electron Microscope (SEM). The upgraded configuration includes high-speed milling, sputter coating, cryo-preparation (down to LN 2 temperature) and air-isolated transfer for atmosphere sensitive specimens (for example Li batter