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New long-term satellite analysis shows

 E-Mail IMAGE: (upper) Changes in rainfall levels between the 2000 s and the 2010 s. (lower) Frequency of precipitation (0.5mm/hr) and heavy precipitation (10.0mm/hr) during the Meiyu-Baiu season over the years.. view more  Credit: Tokyo Metropolitan University Tokyo, Japan - Researchers from Tokyo Metropolitan University have analyzed long-term precipitation radar data from satellites and found significantly enhanced rainfall over the most recent decade during the annual Meiyu-Baiu rainy season in East Asia. The data spans 23 years and gives unprecedented insight into how rainfall patterns have changed. They showed that the increased rainfall was driven by the decadal increased transport of moisture from the tropics and frequent occurrence of the upper tropospheric trough over the front.

New long-term satellite analysis reveals plum rainy season wetter now than ever before

Tokyo Metropolitan University Researchers from Tokyo Metropolitan University have analyzed long-term precipitation radar data from satellites and found significantly enhanced rainfall over the most recent decade during the annual Meiyu-Baiu rainy season in East Asia. The data spans 23 years and gives unprecedented insight into how rainfall patterns have changed. They showed that the increased rainfall was driven by the decadal increased transport of moisture from the tropics and frequent occurrence of the upper tropospheric trough over the front. From the second half of June to the first half of July every year, East Asia is subject to a particularly rainy spell known as the Meiyu (in China) or Baiu (in Japan) season or “plum rains,” from the ripening of plums along the Yangtze River. They are triggered by the so-called Meiyu-Baiu front, where the flow of moist air around the Asian monsoon region meets anti-cyclonic flows around the rim of the western North Pacific subtropical

Nanotechnology Now - Press Release: Stress-free path to stress-free metallic films paves the way for next-gen circuitry: Optimized sputtering technique helps minimize stress in tungsten thin films

Our NanoNews Digest Sponsors Home > Press > Stress-free path to stress-free metallic films paves the way for next-gen circuitry: Optimized sputtering technique helps minimize stress in tungsten thin films (top left) An illustration of the HiPIMS process (top right) The energy distribution of tungsten ions arriving at the substrate over time. At short times, there are a large proportion of ions with high energy. (bottom) Stress-free tungsten films created with the selective pulsed bias technique. (a) Plan view transmission electron microscopy (TEM) image of the film; (b) a higher resolution image; (c) reconstructions of the selected area in (b) based on inverse Fourier transforms, with two regions magnified.

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