Characterizing Ag–In–S Films with AFM : vimars

AFM is a strong technique for analyzing thin films and coatings, and it may provide useful information that is crucial to the performance of a material or process. AFM assesses nanoscale functionalities, including electrical, magnetic, and mechanical characteristics, by quantifying 3D roughness and

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Elizaveta Galitckaiashutterstock , Akhlaqul Karomah , Akhlaqul Karomahjun , Oxford Instruments Group , Advancements In This Research , Asylum Research , Characterizing Thin , Materials Today , Thin Films , Oxford Instruments , Process Diagnostics , Vacuum Deposition Onto Webs , Third Edition , Agins2 , Fm , G In S , Pectroscopy , Raman Spectroscopy ,