Nanoscale Characterization of Polymer Thin Films with AFM :

One of the versatile analytical tools used for the nanoscale characterization of polymeric materials has been atomic force microscopy (AFM).

Related Keywords

Priyom Bose , Egorov Artem Shutterstock , Digital Pulsed Force Mode , Polymer Thin Films , Polymer Thin Films Using Atomic Force , Infrared Spectroscopy , Characterize Polymer Thin , Confocal Raman Microscope , Recent Applications , Advanced Atomic Force Microscopy , Polymer Science , Thin Polymer Films , Nanometer Scale , Confocal Raman , Afm , Olymer , Thin Film ,