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AFM stands for atomic force microscopy and is a type of scanning probe microscope (SPM). SPMs use a probe to evaluate local characteristics such as friction, magnetism, and height. AFM acquires an image by raster-scanning the probe across a small sample area, while simultaneously assessing the local
The microscopic characterization of polymers is key to the understanding of the fundamental structure-function relation on a molecular level and paves the way toward the rational design of novel and improved polymers materials.
One of the versatile analytical tools used for the nanoscale characterization of polymeric materials has been atomic force microscopy (AFM).