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Exploring Thin Films and Coatings with AFM

AFM stands for atomic force microscopy and is a type of scanning probe microscope (SPM). SPMs use a probe to evaluate local characteristics such as friction, magnetism, and height. AFM acquires an image by raster-scanning the probe across a small sample area, while simultaneously assessing the local ....

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Analyzing Polymers with Microscopy: Principles and Applications

The microscopic characterization of polymers is key to the understanding of the fundamental structure-function relation on a molecular level and paves the way toward the rational design of novel and improved polymers materials. ....

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Nanoscale Characterization of Polymer Thin Films with AFM

One of the versatile analytical tools used for the nanoscale characterization of polymeric materials has been atomic force microscopy (AFM). ....

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