Transmission Electron Microscopy (TEM) is a high-resolution imaging method that supplies information regarding the morphology and structure of specimens. In order to penetrate samples, it utilizes a high energy electron beam and renders images using the transmitted part of the beam. As highly accelerated electrons have a small wavelength, they can be employed to resolve small features. This capability is critical in nanotechnology, structural biology, and material science studies. The sample to be imaged must be placed on a special metal grid, which is usually covered with ultra-thin (2-5 nm) polymer or carbon support. It has to undergo a glow discharge process first to ensure the surface support is suitable for use.