Enhancing Chip Yield Through Machine-Learning-Driven Test Analytics Technology
What if you could determine that your semiconductor wafer has problematic dies while it’s being tested, rather than having to wait until the process ...
Stay updated with breaking news from Advantest Cloud Solutions. Get real-time updates on events, politics, business, and more. Visit us for reliable news and exclusive interviews.
What if you could determine that your semiconductor wafer has problematic dies while it’s being tested, rather than having to wait until the process ...
Press release content from Globe Newswire. The AP news staff was not involved in its creation. Advantest Debuts Two New Advantest Cloud Solutions to Boost Production Efficiencies for New IC ... Advantest America, Inc.December 10, 2020 GMT TOKYO, Dec. 10, 2020 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857), working with its partner PDF SolutionsInc. (Nasdaq: PDFS), has introduced two new innovative cloud-based software solutions: the Advantest V93000 Dynamic Parametric Test (DPT) system powered by PDF Exensio® DPT, and an edge high performa...
Advantest Debuts Two New Advantest Cloud Solutions to Boost Production Efficiencies for New IC Designs TOKYO, Dec. 10, 2020 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857), working with its partner PDF Solutions Inc. (Nasdaq: PDFS), has introduced two new innovative cloud-based software solutions: the Advantest V93000 Dynamic Parametric Test (DPT) system powered by PDF Exensio ® DPT, and an edge high performance compute (HPC) system. These solutions are part of the newly introduced Advantest Cloud Solutions™ (ACS), an ecosystem of clo...