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4D Scanning Transmission Electron Microscopy

Published: June 16, 2022

In this article, created from an interview conducted with Colin Ophus from the National Center for Electron Microscopy, the techniques, advantages, and more of 4D Scanning Transmission Electron Microscopy (4D STEM) are discussed.

Source: azom.com

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United StatesThomas SusiVelimir RadmiloviColin OphusHamish BrownJacob MadsenDectris LtdjunUniversity Of MelbourneLawrence Berkeley National Laboratory CenterDectris LtdUniversity Of ViennaScanning Transmission Electron MicroscopyLawrence Berkeley National LaboratoryNational CenterElectron MicroscopyMaterials EngineeringTransmission Electron MicroscopyMaterials ScienceLife ScienceRule ThemMost Crucial Detector Parameters