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In today's industries, quality inspection in semiconductor manufacturing is critical. Many traditional fault detection and diagnosis techniques have been developed to determine the existence of trends or patterns in the process or whether a specific process variable behaves normally.
MIRTEC to Display Award-Winning 3D AOI and SPI Solutions at APEX 2021 Virtual EXPO MIRTEC, ‘The Global Leader in Inspection Technology,’ is pleased to announce its participation in the 2021 IPC APEX Virtual EXPO, scheduled to take place March 9-11, 2021 online at www.ipcapexexpo.org. “We are looking forward to participating in the IPC APEX Virtual EXPO,” stated Brian D’Amico, President of MIRTEC’s North American Sales and Service Division. “MIRTEC will feature video feed and information about our award-winning...