Stay updated with breaking news from Defect Detection. Get real-time updates on events, politics, business, and more. Visit us for reliable news and exclusive interviews.
/PRNewswire/ -- The new ZEISS VoluMax 9 titan is compact design and powerful technology combined. The system comes with 450 kV, thus enabling reliable and...
This article discusses using particle size analysis techniques to detect defects in silicon carbide (SiC), a wide-bandgap semiconductor used in microelectronic devices.
Goodbye to fabric defects with AI fabric inspection from Pailung
/PRNewswire/ -- The "Growth Opportunities in Machine Vision in the Electronics and Semiconductor Industry" report has been added to ResearchAndMarkets.com's...
Wire Arc Additive Manufacturing (WAAM) is a promising manufacturing technology that has been used to build medium to larger-sized components. The recent progress of Artificial Intelligence (AI) technology has led to Machine Learning (ML) algorithms being widely implemented for modeling, control, monitoring, and simulation processes in WAAM. However, current defect detection systems are limited due to the types of detectable defects, and a real-time micro-defect detection system is yet to be developed. This paper aims to provide an in-depth review of process monitoring approaches suitable for a...