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Detecting Defects in Microelectronics Using Particle Analysis

Published: June 5, 2023

This article discusses using particle size analysis techniques to detect defects in silicon carbide (SiC), a wide-bandgap semiconductor used in microelectronic devices.

Source: azonano.com

Related Topics:

Pafnuti ShutterstockNanoscale Research LettersMicroelectronics Using ParticleDefect DetectionSic DeviceMaterials Industry FocusDefect Inspection TechniquesAbrasive Machining ProcessesSecond EditionParticle Size Analysis TechniquesArticle Analysis