Live Breaking News & Updates on Electronic Device Failure Analysis

Sample Preparation and Deprocessing
Silicon Photonic Devices
The symposium has consistently provided attendees with the latest analysis techniques necessary to obtain accurate and timely information on device-related issues. The collected proceedings papers now available in the ASM Digital Library serve as a comprehensive reference of the state-of-the-art research, development, tools, and techniques as presented at ISTFA conferences over the most recent quarter decade.
The launch of ISTFA Proceedings enables convenient access to this valuable content to the EDFAS membership and the broader electronic device community, said Dr. James J. Demarest, EDFAS President. We are very pleased that the ISTFA content was selected by ASM as the first set of conference content to be added to the ASM Digital Library. Enhancing the ability of ISTFA content to be discovered, accessed, and cited has been a significant goal of EDFAS. ....

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