Uniquely sharp X-ray view
Credit: Paul Scherrer Institute/Mahir Dzambegovic Researchers at the Paul Scherrer Institute PSI have succeeded for the first time in looking inside materials using the method of transient grating spectroscopy with ultrafast X-rays at SwissFEL. The experiment at PSI is a milestone in observing processes in the world of atoms. The researchers are publishing their research results today in the journal Nature Photonics. The structures on microchips are becoming ever tinier; hard disks write entire encyclopedias on magnetic disks the size of a fingernail. Many technologies are currently breakin...
Source: eurekalert.org