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A Major Research Instrumentation award from the National Science Foundation will support the permanent acquisition of the Raith VELION focused ion beam scanning electron microscope (FIB-SEM) at MIT.nano for characterization, nanofabrication, and micromanipulation.
Credits: Courtesy of the researchers Caption: This magnified image of the metalens shows its microscopic features. Credits: Courtesy of the researchers Caption: This image shows an optical-microscope view of the metalens. Credits: Courtesy of the researchers Previous image Next image Polished glass has been at the center of imaging systems for centuries. Their precise curvature enables lenses to focus light and produce sharp ...