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Anna Osherov, assistant director for Characterization.nano at MIT's MIT.nano, helps researchers navigate state-of-the-art technologies such as electron microscopy and spectroscopy, as well as instruments that measure mechanical, electrical, magnetic, and topographic properties so they can apply the power of nanoscience and nanotechnology to new discoveries and inventions.
MIT.nano has added several instruments to its tool set, expanding the facilities' nanoscale capabilities.
A Major Research Instrumentation award from the National Science Foundation will support the permanent acquisition of the Raith VELION focused ion beam scanning electron microscope (FIB-SEM) at MIT.nano for characterization, nanofabrication, and micromanipulation.