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Flourishing Automotive Industry to Generate Demand For Titanium-Sapphire Lasers in the U.S by 2031 End

What is Particle Measuring? The process of sizing and counting particulates in a sample is called particle measuring and can be performed in either liquid or air. Industrial processes such as semiconductor wafer fabrication use this technique prominently. These processes have a requirement of high fluidic purity and are especially concerned with the presence of particulate contaminants as they can lead to system damage or product waste. The Challenge Particle measurement is used in semiconductor wafer fabrication processes to ensure that cleaning, cooling, and chemical fluids are contaminan...

Product Announcement Compact, exceptional beam roundness (>93%) and reproducible beam characteristics. Configured for OEMs, the dart, 8 picosecond laser is ideal for micromachining 14 Apr 2021 Drawing on a wealth of technical and application experience from our ARGES and Laser Quantum engineering teams, we have developed Dart, a picosecond laser solution with reliable, repeatable operation to ensure precision in a multitude of applications. Dart offers a leading design for a range of precision processing and microelectronic applications with multiple power levels, wavelengths, and pulse par...

Light, which can be seen by the human eye has a much longer wavelength compared to electrons. In fact, objects can be magnified up to an unrivaled 200,000x using an electron beam with outstanding degrees of chemical specificity. Transmission electron microscopy (TEM) and scanning electron microscopy (SEM) are the two main types of EM. While each technique employs the same fundamental apparatus to yield a focused electron beam that is directed onto the object of interest, they differ in how the samples are illuminated. A TEM utilizes a fluorescent screen to produce a projection image while an ...