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AZoMaterials speaks with Dr. Craig Johnson, Director of Research Core Facilities, and Dr. Kate Vanderburgh, Scanning Electron Microscope (SEM) and X-Ray Microscopy Manager, about the Materials Characterization Core (MCC) facility at Drexel University.
This article outlines this Single-Beam and Dual-Beam Revolution: How FIB Instruments Transformed Sample Preparation
This article explains how to measure steel with bend failure analysis.
Light, which can be seen by the human eye has a much longer wavelength compared to electrons. In fact, objects can be magnified up to an unrivaled 200,000x using an electron beam with outstanding degrees of chemical specificity. Transmission electron microscopy (TEM) and scanning electron microscopy (SEM) are the two main types of EM. While each technique employs the same fundamental apparatus to yield a focused electron beam that is directed onto the object of interest, they differ in how the samples are illuminated. A TEM utilizes a fluorescent screen to produce a projection image while an ...