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Top News In Microscopy Instruments Today - Breaking & Trending Today

Portable and inexpensive stochastic lasers with applications in microscopy

Research led by the Spanish National Research Council (CSIC) has succeeded in developing a new technique for the fabrication of stochastic lasers using electrical power, as described in Nature Pho . ....

Institute Of Materials Sciences Madrid , Spanish National Research Council , Materials Sciences , Tochastic Lasers ,

Customized microscopy systems from IVIM Technology : Get Quote, RFQ, Price or Buy

Customized Microscopy Systems from IVIM Technology ....

Ivim Technology , Intravital Microscopy , Free Space , Icroscopy Systems ,

Microscopy Techniques: An Overview

In this article, Andor Instruments discusses various microscopy techniques, providing a brief overview for each. This includes confocal, widefield, transmitted light and deconvolution techniques. ....

Andor Techonolgy , Marco Campinho , Claudia Florindo , Vincent Boudreau , Wallace Marshall , Detector Technology , Andor Technology Ltd Nov , Andor Technology Ltd , Overview On Andor Microscopy Systems Solutions , Candor Technology , Claudia Florindo Andor Technology , Interference Contrast , Victoria Yan , Phase Contrast , Andor Bench Top Confocal , Point Spread Function , Image Credit , Claudia Florindo Andor , Andor Microscopy Systems ,

E-Mobility quality control: Root cause identification for breakdown of electric drive systems

In this application note, Leica Microsystems demonstrates how you can prevent the breakdown of innovative electronic systems caused by conductive particles and how the Cleanliness Expert software from Leica Microsystems supports the next steps required to achieve a safe electronic society. ....

Leica Microsystems , Application Note , Cleanliness Expert ,

DM6 M LIBS materials analysis solution

In this application note, Leica Microsystems demonstrates how you can visually inspect and chemically analyze in a single work step with your DM6 M LIBS materials analysis solution. Use LIBS to perform advanced material analysis 90% faster compared to inspection with SEM/EDS. ....

Leica Microsystems , Application Note ,