Park Systems Showcases Park NX-TSH a High resolution, automated Tip Scanning Head (TSH) at SEMI Technology Unites Global Summit
Park Systems Showcases Park NX-TSH a High resolution, automated Tip Scanning Head (TSH) at SEMI Technology Unites Global Summit Share Article Park Systems Inc., world-leading manufacturer of Atomic Force Microscopes AFM will showcase their newly launched Park NX-TSH, the only automated Tip Scan Head for large sample analysis over 300 mm at the SEMI Technology Unites Global Summit Feb. 15-19, 2021. Park NX-TSH is for large and heavy sample flat panel display glass, 2D encoder sample and features conductive AFM for electric defect analysis by integrating a micro probe station. Park NX-TSH Tip ...