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Automotive-grade controllers for PCIe 2.0/1.0 supporting Endpoint, Root Complex, Switch Port, and Dual Mode applications

The complete silicon-proven Synopsys IP solution, consisting of configurable digital controllers, PHYs, Integrity and Data Encryption (IDE) Security Modules, . ....

Data Encryption , Security Modules , Utomotive Grade Controllers For Pcie 2 0 1 Supporting Endpoint , Root Complex , Switch Port , Nd Dual Mode Applications , Wc Pci Express 1 2 3 4 5 Controller Automotive , P Core , Ilicon Ip , Emiconductor Ip ,

HPCwire: Global News on High Performance Computing (HPC)

HPCwire: Global News on High Performance Computing (HPC)
hpcwire.com - get the latest breaking news, showbiz & celebrity photos, sport news & rumours, viral videos and top stories from hpcwire.com Daily Mail and Mail on Sunday newspapers.

John Swanson , Sam Altman , Office Of Science , Scientific Computing Research , Swanson Analysis Systems Inc , Us Department Of Energy , Sam Alman , Historically Black Colleges , Swanson Analysis Systems , Computer Aided Engineering , Advanced Scientific Computing Research ,

Imec launches the first design pathfinding process design kit for N2 node

The design pathfinding PDK lowers the threshold for academia and industry to access the most advanced semiconductor technologies ....

Region Flamande , Julien Ryckaert , Yoon Kim , Brandon Wang , Vp Cadence Academic Network , International Solid , Cadence Design Systems , Solid State Circuits Conference ,

New Electronics - Imec launches design pathfinding PDK for most advanced semiconductor technologies

Imec, the research and innovation hub in nanoelectronics and digital technologies, has announced the launch of its latest open process design kit (PDK), alongside a training program offered through EUROPRACTICE. ....

Julien Ryckaert , Brandon Wang , International Solid , Cadence Design Systems , Solid State Circuits Conference ,

Enhancing Chip Yield Through Machine-Learning-Driven Test Analytics Technology

What if you could determine that your semiconductor wafer has problematic dies while it’s being tested, rather than having to wait until the process . ....

Advantest Cloud Solutions , Synopsys Silicon , Enhancing Chip Yield Machine Learning Driven Test Analytics , Ynopsys Blog , Guy Cortez ,