Large Format Inspection And Metrology System Nexview LS650
The Nexview™ LS650 system utilizes Coherence Scanning Interferometry (CSI) measurement technology at its core. This non-contact technology offers high-precision, and high-value surface metrology benefits including measurements of all types of surfaces, sub-nanometer measurements, gage capable performance, and SureScan™ vibration tolerance technology. For more features and specifications on the Nexview™ LS650, download the datasheet. Need More Information? Just Ask. Click the button below to directly contact the supplier. Use it to: Ask a question. Discuss your current project/applicati...
Source: photonicsonline.com