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The Nexview™ LS650 system utilizes Coherence Scanning Interferometry (CSI) measurement technology at its core. This non-contact technology offers high-precision, and high-value surface metrology benefits including measurements of all types of surfaces, sub-nanometer measurements, gage capable performance, and SureScan™ vibration tolerance technology.
For more features and specifications on the Nexview™ LS650, download the datasheet.
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