Development In Characterization Using News Today : Breaking News, Live Updates & Top Stories | Vimarsana

This article presents the advancement of MEMS nanoindenterfor AFM probes for nanomechanical analysis of soft materials.

South carolinaUnited statesAkanksha uradeAkanksha urademarUniversity of waterlooDevelopment in characterization usingNanomechanical measurementCharacterization usingIntegrated circuit scanning probe instrumentsThin films