New Solutions in Semiconductor Metrology : vimarsana.com

New Solutions in Semiconductor Metrology

KLA Instruments™, a division of KLA Corporation, has expanded its defect inspection and metrology portfolio in 2023 to include new systems for semiconductor process development and control, including the Filmetrics® R54-300 sheet resistance mapping system, the F54-XYT-300 and F60-c film thickness mapping systems, and the Nano Indenter® G200X with the Semiconductor Pack.

Related Keywords

, Semiconductor Pack , Nano Indenter , Semi Pack , Semiconductor , Metrology ,

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