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Bruker Introduces Next-Generation 3D Areal Surface Measurement Technology for Production and Research Environments

Published: February 1, 2023

At the SPIE Photonics West 2023 Exhibition, Bruker Corporation today announced the release of two new white-light interferometry (WLI) systems: the ContourX-1000 and NPFLEX-1000 optical profilometers.

Source: azom.com

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United StatesLouis CastelDon CohenSamuel LeskoBruker Nano SurfacesfebBruker CorporationFrom Bruker Nano SurfacesfebAdvanced Find SurfaceSenior DirectorGeneral ManagerOptical MetrologyImage CreditBruker NanoUniversal Scanning Interferometry