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Aehr Test Systems to Participate in the 21st Annual Craig-Hallum Institutional Investor Conference on May 29 - Vimarsana News

Aehr Test Systems to Participate in the 21st Annual Craig-Hallum Institutional Investor Conference on May 29

FREMONT, CA / ACCESSWIRE / May 21, 2024 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that President and CEO Gayn Erickson will be

Aehr Test Systems (NASDAQ:AEHR) Q3 2024 Earnings Call Transcript - Vimarsana News

Aehr Test Systems (NASDAQ:AEHR) Q3 2024 Earnings Call Transcript

Aehr Test Systems (NASDAQ:AEHR) Q3 2024 Earnings Call Transcript April 9, 2024 Aehr Test Systems misses on earnings expectations. Reported EPS is $-0.03 EPS, expectations were $-0.02625. AEHR isn’t one of the 30 most popular stocks among hedge funds at the end of the third quarter (see the details here). Operator: Greetings. Welcome to the […]

Source: yahoo.com
Aehr quarterly revenue halves due to short-term SiC-related order push-outs following EV market slowdown - Vimarsana News

Aehr quarterly revenue halves due to short-term SiC-related order push-outs following EV market slowdown

Revenue to rebound this quarter; full-year to still match or exceed prior year

Aehr Test Systems (AEHR) Reports Q3 Fiscal 2024 Results, Reiterates Full Year Guidance - Vimarsana News

Aehr Test Systems (AEHR) Reports Q3 Fiscal 2024 Results, Reiterates Full Year Guidance

Performance Misses Quarterly Estimates but Maintains Annual Outlook

Source: yahoo.com
Aehr Test : Receives Order from New Customer for FOX-NP™ Multi-Wafer Test and Burn-in System for Silicon Carbide Power MOSFETs -April 02, 2024 at 05:13 am EDT - Vimarsana News

Aehr Test : Receives Order from New Customer for FOX-NP™ Multi-Wafer Test and Burn-in System for Silicon Carbide Power MOSFETs -April 02, 2024 at 05:13 am EDT

Aehr Test Systems , a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an initial customer order for a FOX-NP™ wafer level test and burn-in system,...