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Although electron microscopy can already reveal details as small as one nanometer, ongoing research seeks to break through barriers limiting image quality and reducing the optical dose on the samples. Aberration is a common problem in electron microscopy that can reduce the resolution and quality of the images produced.
Anna Osherov, assistant director for Characterization.nano at MIT's MIT.nano, helps researchers navigate state-of-the-art technologies such as electron microscopy and spectroscopy, as well as instruments that measure mechanical, electrical, magnetic, and topographic properties so they can apply the power of nanoscience and nanotechnology to new discoveries and inventions.
A slow-motion movie on sports television channels shows processes in hundredths of a second. By contrast, processes on the nanoscale take place in the so-called femtosecond range: For example, an ...
/PRNewswire/ -- The Canadian Centre for Electron Microscopy (CCEM), located at McMaster University, recently acquired a ZEISS Crossbeam 350 laser FIB-SEM and a...
The atomic structure of solid substances can often be analysed quickly, easily and very precisely using X-rays. However, this requires that crystals of the corresponding substances exist. Chemist ...