Hprobe Announces New Generation of Magnetic Test Head for Wafer Sort of MRAM in Mass Production
Grenoble, France, November 30, 2021 – Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today announced a breakthrough magnetic test head revolutionizing MRAM Wafer Sort (WS). The new module, the H3DM-XL, is at the heart of the latest addition to Hprobe’s IBEX line, the IBEX-WS. The IBEX-WS test equipment integrates 3D magnetic field…
Source: eejournal.com