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JEOL Introduces New FIB-SEM

From JEOL USA, Inc. Feb 2 2023 JEOL has developed a new Focused Ion Beam (FIB) solution for preparation of specimens prior to observation in the Transmission Electron Microscope (TEM). ....

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JEOL: Launch of the FIB-SEM System "JIB-PS500i" with High Precision and High Resolution

JEOL: Launch of the FIB-SEM System "JIB-PS500i" with High Precision and High Resolution
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