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Characterizing Microlenses via White Light Interferometry - Vimarsana News

Characterizing Microlenses via White Light Interferometry

Published: July 31, 2023

Because of their ever-increasing use in a variety of applications, microlenses and their design are constantly being improved to reduce distortion, astigmatism, or other problems that can impede observation. In this article, Bruker explains how white light interferometry can be used to characterize microlenses.

Source: azom.com
Related Topics:
Roger PosustaBruker SurevisionLouis CastelBruker NanoBruker Nano SurfacesTip TiltMultiple RegionImage CreditZernike GenerationSubtract AsphereSamuel LeskoWhite Light Interferometry
Contour X - 500 3D Optical Profilometer : Quote, RFQ, Price and Buy - Vimarsana News

Contour X - 500 3D Optical Profilometer : Quote, RFQ, Price and Buy

Published: June 8, 2022

This product profile outlines the features and benefits of the Contour X - 500 3D Optical Profilometer.

Source: azom.com
Related Topics:
Bruker DaltonicsBruker ScientificUnmatched BenchtopUniversal Scanning InterferometryMultiple RegionIndependent MetrologyContourx 500 3d Optical Profilometer