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Physicist Develops Single-Shot Technique for Semiconductor Analysis

Published: February 22, 2024

A novel technique for the thorough characterization of semiconductors in a single measurement has been developed by an HZB physicist.

Source: azooptics.com

Related Topics:

United KingdomUnited StatesSkyla BailyArtem MusiienkoLaura CanilVitaly PodzorovEuropean Patent OfficeUniversity Of PotsdamRutgers UniversityTechnique For Semiconductor AnalysisNature ElectronicsNature CommunicationsTesting Different Semiconductor MaterialsDevelops Single Shot TechniqueSemiconductor AnalysisLight Induced Magneto TransportCurie Postdoctoral FellowshipHelmholtz Zentrum BerlinEvery Compact

Unique X-ray Topography Based Defect Characterization for SiC Wafers Honored with Georg Waeber Innovation Award 2023

Published: November 2, 2023

A cross-organizational team from Rigaku SE and Fraunhofer IISB has established a new semiconductor material characterization method in their jointly operated Center of Expertise for X-ray Topograp ...

Source: chemeurope.com

Related Topics:

Michael HipplerChristian KranertChristian ReimannMaterials DepartmentV Microelectronics Promotion SocietyNuremberg ChamberUniversity Of ErlangenX Ray TopographyManaging DirectorRigaku EuropeGeorg Waeber Innovation AwardMicroelectronics Promotion SocietyGeorg Waeber InnovationSemiconductor AnalysisSilicon CarbideQuality Control