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A collaboration of NTU Singapore and KIMM Korea researchers have produced a next-generation semiconductor wafer that could be key to addressing the global chip shortage.
Press release content from PR Newswire. The AP news staff was not involved in its creation.
HSINCHU, Taiwan, March 3, 2022 /PRNewswire/ -- As chip sizes continue to shrink, high-performance Magnetic Random Access Memory (MRAM) technology ...
Grenoble, France, November 30, 2021 – Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today announced a breakthrough magnetic test head revolutionizing MRAM Wafer Sort (WS). The new module, the H3DM-XL, is at the heart of the latest addition to Hprobe’s IBEX line, the IBEX-WS. The IBEX-WS test equipment integrates 3D magnetic field…
(0) Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today announced a significant order from a tier-1 semiconductor manufacturer for a wafer-level magnetic tester. The equipment will be used for research and development of magnetic materials and devices, which represents a very promising technology for MRAM chips and magnetic sensors. With this announcement, Hprobe's IBEX tester is clearly recognized as an essential solution for the industry. With its very high throughput, the state-of the-art ATE enables high productivity engineering, fast ti...