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Characterizing Li-Ion Battery Components Using FIB-SEM Tomography

Characterizing Li-Ion Battery Components Using FIB-SEM Tomography
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Automation for Sustained Quality in TEM Sample Preparation

This article explores how automation can be utilized to increase throughput and establish reproducible and sustained quality for TEM sample preparation. ....

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Preventing Sample Surface Damage Through Plasma FIB-SEM Large Area Polishing

This article explores how sample surface damage can be reduced using Plasma FIB-SEM low angle large area polishing. ....

United States , Aimee Molineux , United States Inc Apr , Tescan United States Inc , United States Inc , States Inc Apr , Electron Backscatter Diffraction , Angle Polishing , Low Angle Polishing , Oxford Instruments , Image Credit , Tescan United States , Plasma Fib Sem ,

Exploring Tescan's TENSOR: The Medium Voltage, Near-UHV, Integrated 4D-STEM

In this interview, AZoM speaks with Robert Stroud, Sales Manager for TESCAN USA, about the applications and benefits of the TENSOR, a medium voltage, near-UHV, integrated 4D-STEM. ....

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