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Preventing Sample Surface Damage Through Plasma FIB-SEM Large Area Polishing

This article explores how sample surface damage can be reduced using Plasma FIB-SEM low angle large area polishing. ....

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Electron Microscope Market size to grow by USD 1.68 billion from 2022 to 2027; APAC to account for 55% of market growth- Technavio

Electron Microscope Market size to grow by USD 1.68 billion from 2022 to 2027; APAC to account for 55% of market growth- Technavio ....

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Advancing Science and Education through Nano-scale Materials Characterization

AZoMaterials speaks with Dr. Craig Johnson, Director of Research Core Facilities, and Dr. Kate Vanderburgh, Scanning Electron Microscope (SEM) and X-Ray Microscopy Manager, about the Materials Characterization Core (MCC) facility at Drexel University. ....

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Advancements and Major Players in Nanometrology: Navigating the Precision Frontier

Advancements and Major Players in Nanometrology: Navigating the Precision Frontier
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Electron Backscatter Diffraction (EBSD) in Materials Science

In this interview, Dr. Stuart Wright, a Senior Scientist at Gatan/EDAX, talks to AZoMaterials about the versatile applications of Electron Backscatter Diffraction (EBSD) in materials science and metallurgy. ....

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