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As Good as it Gets: NIST Develops Its Fourth Generation Wire Micrometer that Rivals Best in World


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As Good as it Gets: NIST Develops Its Fourth Generation Wire Micrometer that Rivals Best in World
The main structural components of the new NIST micrometer–a device for measuring the thickness of fine wire, narrow fibers and similar objects-are made of Invar, a nickel-iron alloy that does not react to small changes in temperature. As a result, the measuring device is less prone to error than other state-of-the-art instruments. A laser beam enters from the left side of the drawing and enters a beam splitter cube (1), which divides the beam into two parts. One part remains in the cube, is reflected from a side mirror back towards the center and serves as the reference beam. The other part hits the retroreflector (2). As the floating carriage (3) moves away from the splitter cube and toward the back end of the anvil (4), the distance between the retroreflector and the cube splitter varies (5 When the two beam are brought back together, the laser reports ....

Ted Doiron , National Institute Of Standards , National Institute , John Stoup , Novel High Accuracy Micrometer , டெட் தோய்றோன் , தேசிய நிறுவனம் ஆஃப் தரநிலைகள் , தேசிய நிறுவனம் , ஜான் ஸ்டூப் ,