Press release content from Business Wire. The AP news staff was not involved in its creation. JEDEC Wide Bandgap Power Semiconductor Committee Publishes New Test Method for Continuous-Switching Evaluation of GaN Power Conversion Devices January 26, 2021 GMT ARLINGTON, Va.--(BUSINESS WIRE)--Jan 26, 2021-- JEDEC Solid State Technology Association, the global leader in standards development for the microelectronics industry, announces the publication of JEP182: Test Method for Continuous-Switching Evaluation of Gallium Nitride Power Conversion Devices. Developed by JEDEC’s JC-70 Committee for Wide Bandgap Power Electronic Conversion Semiconductors, JEP182 is available for free download from the JEDEC website. ADVERTISEMENT To enable the successful adoption of GaN power transistors, both reliable operation in power conversion applications and switching lifetime need to be demonstrated. JEP182, along with guidelines previously published by JC-70, helps address that need by expanding the ecosystem of JEDEC guidelines for reliability evaluation, test, and characterization of GaN power transistors under continuous switching conditions in power conversion applications.