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ASFETs for hot-swap and soft-start

ASFETs for hot-swap and soft-start
Nexperia has brought out 80V and 100V ASFETs with enhanced SOA performance, targeting hot-swap & soft-start applications in 5G telecom systems & 48 V server environments and industrial equipment needing e-fuse and battery protection.
ASFETs are a new breed of MOSFET optimized for use in particular design scenarios. By focusing on specific parameters critical to an application, sometimes at the expense of others that are less important in the same design, new levels of performance can be achieved.
The ASFETs use a combination of Nexperia’s latest silicon technology and copper-clip package construction to significantly strengthen the Safe Operating Area (SOA) and minimize PCB area. ....

United Kingdom , Mike Becker , Senior International Product Marketing , Safe Operating Area , Senior International Product Marketing Manager , ஒன்றுபட்டது கிஂக்டம் , மைக் பெக்கர் , பாதுகாப்பானது இயங்குகிறது பரப்பளவு ,

Nexperia releases 80V and 100V ASFETs

Nexperia releases 80V and 100V ASFETs
newelectronics.co.uk - get the latest breaking news, showbiz & celebrity photos, sport news & rumours, viral videos and top stories from newelectronics.co.uk Daily Mail and Mail on Sunday newspapers.

United Kingdom , Mike Becker , Senior International Product Marketing , Safe Operating Area , Senior International Product Marketing Manager , ஒன்றுபட்டது கிஂக்டம் , மைக் பெக்கர் , பாதுகாப்பானது இயங்குகிறது பரப்பளவு ,

JEDEC publishes New Test Method to evaluate power GaN devices

JEDEC publishes New Test Method to evaluate power GaN devices
JEDEC Solid State Technology Association announces the publication of JEP182: Test Method for Continuous-Switching Evaluation of Gallium Nitride Power Conversion Devices. Developed by JEDEC’s JC-70 Committee for Wide Bandgap Power Electronic Conversion Semiconductors, JEP182 is available for free download from the JEDEC website.
To enable the successful adoption of GaN power transistors, both reliable operation in power conversion applications and switching lifetime need to be demonstrated. JEP182, along with guidelines previously published by JC-70, helps address that need by expanding the ecosystem of JEDEC guidelines for reliability evaluation, test, and characterization of GaN power transistors under continuous switching conditions in power conversion applications. ....

United States , Stephanie Watts Butler , Texas Instruments , Solid State Technology Association , New Test Method , State Technology Association , Test Method , Continuous Switching Evaluation , Gallium Nitride Power Conversion , Safe Operating Area , Middle East , Power Gan , ஒன்றுபட்டது மாநிலங்களில் , மாற்றாந்தாய் வாட்ஸ் பட்லர் , டெக்சாஸ் கருவிகள் , திட நிலை தொழில்நுட்பம் சங்கம் , புதியது சோதனை முறை , நிலை தொழில்நுட்பம் சங்கம் , சோதனை முறை , தொடர்ச்சியான மாறுதல் மதிப்பீடு , பாதுகாப்பானது இயங்குகிறது பரப்பளவு , நடுத்தர கிழக்கு , பவர் கண் ,

JEDEC Wide Bandgap Power Semiconductor Committee Publishes New Test Method for Continuous-Switching Evaluation of GaN Power Conversion Devices

Press release content from Business Wire. The AP news staff was not involved in its creation.
JEDEC Wide Bandgap Power Semiconductor Committee Publishes New Test Method for Continuous-Switching Evaluation of GaN Power Conversion Devices
January 26, 2021 GMT
ARLINGTON, Va. (BUSINESS WIRE) Jan 26, 2021
JEDEC Solid State Technology Association, the global leader in standards development for the microelectronics industry, announces the publication of JEP182: Test Method for Continuous-Switching Evaluation of Gallium Nitride Power Conversion Devices. Developed by JEDEC’s JC-70 Committee for Wide Bandgap Power Electronic Conversion Semiconductors, JEP182 is available for free download from the JEDEC website.
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To enable the successful adoption of GaN power transistors, both reliable operation in power conversion applications and switching lifetime need to be demonstrated. JEP182, along with guidelines previously published by JC-70, helps address th ....

United States , Emily Desjardins , Stephanie Watts Butler , Texas Instruments , Solid State Technology Association , State Technology Association , Test Method , Continuous Switching Evaluation , Gallium Nitride Power Conversion , Safe Operating Area , Middle East , Business Wire , ஒன்றுபட்டது மாநிலங்களில் , எமிலி சேஜார்டின்ஸ் , மாற்றாந்தாய் வாட்ஸ் பட்லர் , டெக்சாஸ் கருவிகள் , திட நிலை தொழில்நுட்பம் சங்கம் , நிலை தொழில்நுட்பம் சங்கம் , சோதனை முறை , தொடர்ச்சியான மாறுதல் மதிப்பீடு , பாதுகாப்பானது இயங்குகிறது பரப்பளவு , நடுத்தர கிழக்கு , வணிக கம்பி ,

Space design: Rad-hard and integrated – a space component checklist

Space design: Rad-hard and integrated – a space component checklist
Designing electronic boards for use in space can be hindered by radiation, a vacuum environment and cost, write Thibault Brunet, Salvo Pappalardo and Ferdinando Tonicello.
Figure 1: Latching current limiters distribute power from the main bus to relevant loads
The design of electronics boards for space applications, whether for satellites or for manned missions, faces several challenges simultaneously.
The presence of radiation can modify or destroy components, the vacuum environment limits power dissipation to conduction and there is also the high cost of launching and flying spacecraft, as well as the critical nature of many missions. An added complication is that maintenance is next to impossible to do on-the-fly. ....

Ferdinando Tonicello , Thibault Brunet , European Space Agency , Safe Operating Area , Author Thibault Brunet , Salvo Pappalardo , European Space , திபோுல்ட் அழகி , பாதுகாப்பானது இயங்குகிறது பரப்பளவு , நூலாசிரியர் திபோுல்ட் அழகி , ஐரோப்பிய இடம் ,