Physicists Find New Way to Measure Properties of a Material'

Physicists at The University of Texas at Arlington have developed a new technique that can measure the properties of the topmost atomic layer of materials without including information from the underlying layers.

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Finland , Texas , United States , Varghese Chirayath , Alex Weiss , Megan Craig , Alex Fairchild , Bernardo Barbiellini , Saurabh Mukherjee , Ali Koymen , Randall Gladen , Fairchild , Department Of Physics , National Science Foundation , Positron Lab , Welch Foundation , University Of Texas At Arlington , Auger Mediated Positron Sticking , Physical Review Letters , That Doesnt Scratch , Physical Review , Industry Focus , National Science ,