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Physicists at The University of Texas at Arlington have developed a new technique that can measure the properties of the topmost atomic layer of materials without including information from the un ...
Researchers from Northeastern University in Boston and University of Texas at Arlington (UTA) have used a process called auger-mediated positron sticking (AMPS) to develop a new technique that can measure the properties of the topmost atomic layer of materials. This spectroscopic tool uses virtual photons to measure the topmost atomic layer’s electronic structure selectively. When incoming positrons change from vacuum states to bound surface states on the sample surface, they produce virtual photons with the energy to excite electrons into the vacuum.
Scientists have developed a new technique that can measure the properties of the topmost atomic layer of materials without including information.
Physicists at The University of Texas at Arlington have developed a new technique that can measure the properties of the topmost atomic layer of materials without including information from the underlying layers.
Researchers at The University of Texas at Arlington have created a brand-new method for measuring the properties of the topmost atomic layer of materials without taking into account data from the deeper layers.