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In this interview, AZoNano speaks with Dr. George Heath from the University of Leeds, UK, about the fundamental principles of Atomic Force Microscopy (AFM), integration with advanced optical microscopy, and relevant applications. He also discusses his research utilizing the NanoRacer.
Bruker today announced at the 12th International Conference on Industrial Computed Tomography the new SKYSCANTM 2214 CMOS Edition, a multiscale X-ray microscope based on nano-CT (computed tomography) for industrial and academic research.
Bruker today announced the release of the JPK NanoWizard® V BioAFM, a novel system that marks a milestone in automation and ease of use for life science atomic force microscopy research.
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In this interview, Prof. Hanno zur Loye from the University of South Carolina, describes his research involving X-Ray Diffraction to investigate the crystal growth of new materials.