EFNS Tech Day 2024 by Bruker
The University Paris-Saclay in Orsay, France.
Source: azonano.com
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Using Atomic Force Microscopy to Look at Thin Ice
Images of two-dimensional ice captured using atomic force microscopy (AFM) demonstrate a previously unseen growth mechanism.
Source: azooptics.com
Using 3D Optical Profiling for Full-Field Hotspot Detection
Chemical mechanical polishing (CMP) – also known as planarization – has long been the most commonly employed technique for smoothing and flattening wafer surfaces during the fabrication of semiconductor integrated chips (IC). This approach has been common practice for decades. During this time, post-CMP evaluation has become the standard means of ensuring adequate planarity of IC layers, as well as the most common approach to confirming their compliance with planarity requirements. Conventional post-CMP process evaluation methods have analytical limitations, however. Ever tightening proce...
Source: azom.com