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IMAGE: Artistic depiction of XFEL measurement with neon gas. The inherent delay between the emission of photoelectrons and Auger electrons leads to a characteristic ellipse in the analyzed data. In principle,...
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Credit: (Image by Daniel Haynes and Jörg Harms/Max Planck Institute for the Structure and Dynamics of Matter.)
Breakthrough greatly enhances the ultrafast resolution achievable with X-ray free-electron lasers.
A large international team of scientists from various research organizations, including the U.S. Department of Energy's (DOE) Argonne National Laboratory, has developed a method that dramatically improves the already ultrafast time resolution achievable with X-ray free-electron lasers (XFELs). It could lead to breakthroughs on how to design new materials and more efficient chemical processes.